In situ synchrotron radiation grazing incidence X-ray diffraction - A powerful technique for the characterization of solid-state ion-selective electrode surfaces
An in situ surface study of the iron chalcogenide glass membrane ion-selective electrode (ISE) in aqueous media has been undertaken using a tandem technique of mixed potential/synchrotron radiation grazing incidence X-ray diffraction (SR-GIXRD) and atomic force microscopy (AFM). This work has simult...
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| Format: | Journal Article |
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Pergamon-Elsevier Science Ltd
2006
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| Online Access: | http://hdl.handle.net/20.500.11937/40911 |
| _version_ | 1848755997975248896 |
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| author | De Marco, Roland Jiang, Zhong-Tao Pejcic, Bobby Van Riessen, Arie |
| author_facet | De Marco, Roland Jiang, Zhong-Tao Pejcic, Bobby Van Riessen, Arie |
| author_sort | De Marco, Roland |
| building | Curtin Institutional Repository |
| collection | Online Access |
| description | An in situ surface study of the iron chalcogenide glass membrane ion-selective electrode (ISE) in aqueous media has been undertaken using a tandem technique of mixed potential/synchrotron radiation grazing incidence X-ray diffraction (SR-GIXRD) and atomic force microscopy (AFM). This work has simultaneously monitored the mixed potential and in situ surface diffraction patterns of this crystalline glassy material, showing that the observed gradual shift of the electrode potential in the anodic direction is linked to the preferential dissolution of the GeSe (1 1 1), GeSe (1 0 1) and GeSe (1 4 1) and/or Sb2Se3 (0 1 3), Sb2Se3 (2 2 1) and Sb2Se3 (0 2 0) surfaces. Expectedly, these observations are internally consistent with preferential oxidative attack of the crystalline regions of the membrane comprising GeSe and/or Sb2Se3, as evidenced by AFM imaging of the electrode surface. Clearly, this work corroborates the results of previous ex situ surface studies on the iron chalcogenide glass ISE, whereby it was shown that alkaline saline solutions have a tendency to alter the surface chemistry and concomitant response characteristics of the ISE. |
| first_indexed | 2025-11-14T09:05:12Z |
| format | Journal Article |
| id | curtin-20.500.11937-40911 |
| institution | Curtin University Malaysia |
| institution_category | Local University |
| last_indexed | 2025-11-14T09:05:12Z |
| publishDate | 2006 |
| publisher | Pergamon-Elsevier Science Ltd |
| recordtype | eprints |
| repository_type | Digital Repository |
| spelling | curtin-20.500.11937-409112017-09-13T14:03:54Z In situ synchrotron radiation grazing incidence X-ray diffraction - A powerful technique for the characterization of solid-state ion-selective electrode surfaces De Marco, Roland Jiang, Zhong-Tao Pejcic, Bobby Van Riessen, Arie Ion-selective electrode Electrode dynamics Synchrotron radiation grazing incidence X-ray diffraction Atomic force microscopy Chalcogenide glass An in situ surface study of the iron chalcogenide glass membrane ion-selective electrode (ISE) in aqueous media has been undertaken using a tandem technique of mixed potential/synchrotron radiation grazing incidence X-ray diffraction (SR-GIXRD) and atomic force microscopy (AFM). This work has simultaneously monitored the mixed potential and in situ surface diffraction patterns of this crystalline glassy material, showing that the observed gradual shift of the electrode potential in the anodic direction is linked to the preferential dissolution of the GeSe (1 1 1), GeSe (1 0 1) and GeSe (1 4 1) and/or Sb2Se3 (0 1 3), Sb2Se3 (2 2 1) and Sb2Se3 (0 2 0) surfaces. Expectedly, these observations are internally consistent with preferential oxidative attack of the crystalline regions of the membrane comprising GeSe and/or Sb2Se3, as evidenced by AFM imaging of the electrode surface. Clearly, this work corroborates the results of previous ex situ surface studies on the iron chalcogenide glass ISE, whereby it was shown that alkaline saline solutions have a tendency to alter the surface chemistry and concomitant response characteristics of the ISE. 2006 Journal Article http://hdl.handle.net/20.500.11937/40911 10.1016/j.electacta.2006.01.034 Pergamon-Elsevier Science Ltd restricted |
| spellingShingle | Ion-selective electrode Electrode dynamics Synchrotron radiation grazing incidence X-ray diffraction Atomic force microscopy Chalcogenide glass De Marco, Roland Jiang, Zhong-Tao Pejcic, Bobby Van Riessen, Arie In situ synchrotron radiation grazing incidence X-ray diffraction - A powerful technique for the characterization of solid-state ion-selective electrode surfaces |
| title | In situ synchrotron radiation grazing incidence X-ray diffraction - A powerful technique for the characterization of solid-state ion-selective electrode surfaces |
| title_full | In situ synchrotron radiation grazing incidence X-ray diffraction - A powerful technique for the characterization of solid-state ion-selective electrode surfaces |
| title_fullStr | In situ synchrotron radiation grazing incidence X-ray diffraction - A powerful technique for the characterization of solid-state ion-selective electrode surfaces |
| title_full_unstemmed | In situ synchrotron radiation grazing incidence X-ray diffraction - A powerful technique for the characterization of solid-state ion-selective electrode surfaces |
| title_short | In situ synchrotron radiation grazing incidence X-ray diffraction - A powerful technique for the characterization of solid-state ion-selective electrode surfaces |
| title_sort | in situ synchrotron radiation grazing incidence x-ray diffraction - a powerful technique for the characterization of solid-state ion-selective electrode surfaces |
| topic | Ion-selective electrode Electrode dynamics Synchrotron radiation grazing incidence X-ray diffraction Atomic force microscopy Chalcogenide glass |
| url | http://hdl.handle.net/20.500.11937/40911 |