APA (7th ed.) Citation

De Marco, R., Jiang, Z., Pejcic, B., & Van Riessen, A. (2006). In situ synchrotron radiation grazing incidence X-ray diffraction - A powerful technique for the characterization of solid-state ion-selective electrode surfaces. Pergamon-Elsevier Science Ltd.

Chicago Style (17th ed.) Citation

De Marco, Roland, Zhong-Tao Jiang, Bobby Pejcic, and Arie Van Riessen. In Situ Synchrotron Radiation Grazing Incidence X-ray Diffraction - A Powerful Technique for the Characterization of Solid-state Ion-selective Electrode Surfaces. Pergamon-Elsevier Science Ltd, 2006.

MLA (9th ed.) Citation

De Marco, Roland, et al. In Situ Synchrotron Radiation Grazing Incidence X-ray Diffraction - A Powerful Technique for the Characterization of Solid-state Ion-selective Electrode Surfaces. Pergamon-Elsevier Science Ltd, 2006.