Computation of Probability Coefficients using Binary Decision Diagram and their Application in Test Vector Generation

This paper deals with efficient computation of probability coefficients which offers computational simplicity as compared to spectral coefficients. It eliminates the need of inner product evaluations in determination of signature of a combinational circuit realizing given Boolean function. The metho...

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Main Authors: Singh, Ashutosh Kumar, Mohan, A.
Format: Journal Article
Published: World Academy of Science, Engineering and Technology 2009
Subjects:
Online Access:http://hdl.handle.net/20.500.11937/38318
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author Singh, Ashutosh Kumar
Mohan, A.
author_facet Singh, Ashutosh Kumar
Mohan, A.
author_sort Singh, Ashutosh Kumar
building Curtin Institutional Repository
collection Online Access
description This paper deals with efficient computation of probability coefficients which offers computational simplicity as compared to spectral coefficients. It eliminates the need of inner product evaluations in determination of signature of a combinational circuit realizing given Boolean function. The method for computation of probability coefficients using transform matrix, fast transform method and using BDD is given. Theoretical relations for achievable computational advantage in terms of required additions in computing all 2n probability coefficients of n variable function have been developed. It is shown that for n>5, only 50% additions are needed to compute all probability coefficients as compared to spectral coefficients. The fault detection techniques based on spectral signature can be used with probability signature also to offer computational advantage.
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format Journal Article
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institution Curtin University Malaysia
institution_category Local University
last_indexed 2025-11-14T08:53:55Z
publishDate 2009
publisher World Academy of Science, Engineering and Technology
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spelling curtin-20.500.11937-383182017-01-30T14:16:41Z Computation of Probability Coefficients using Binary Decision Diagram and their Application in Test Vector Generation Singh, Ashutosh Kumar Mohan, A. Spectral Coefficients Binary Decision Diagrams Fault detection This paper deals with efficient computation of probability coefficients which offers computational simplicity as compared to spectral coefficients. It eliminates the need of inner product evaluations in determination of signature of a combinational circuit realizing given Boolean function. The method for computation of probability coefficients using transform matrix, fast transform method and using BDD is given. Theoretical relations for achievable computational advantage in terms of required additions in computing all 2n probability coefficients of n variable function have been developed. It is shown that for n>5, only 50% additions are needed to compute all probability coefficients as compared to spectral coefficients. The fault detection techniques based on spectral signature can be used with probability signature also to offer computational advantage. 2009 Journal Article http://hdl.handle.net/20.500.11937/38318 World Academy of Science, Engineering and Technology fulltext
spellingShingle Spectral Coefficients
Binary Decision Diagrams
Fault detection
Singh, Ashutosh Kumar
Mohan, A.
Computation of Probability Coefficients using Binary Decision Diagram and their Application in Test Vector Generation
title Computation of Probability Coefficients using Binary Decision Diagram and their Application in Test Vector Generation
title_full Computation of Probability Coefficients using Binary Decision Diagram and their Application in Test Vector Generation
title_fullStr Computation of Probability Coefficients using Binary Decision Diagram and their Application in Test Vector Generation
title_full_unstemmed Computation of Probability Coefficients using Binary Decision Diagram and their Application in Test Vector Generation
title_short Computation of Probability Coefficients using Binary Decision Diagram and their Application in Test Vector Generation
title_sort computation of probability coefficients using binary decision diagram and their application in test vector generation
topic Spectral Coefficients
Binary Decision Diagrams
Fault detection
url http://hdl.handle.net/20.500.11937/38318