Atom probe tomography studies of gan-based semiconductor materials

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Atom probe tomography studies of gan-based semiconductor materials

Bibliographic Details
Main Authors:	Bennett, S., Oliver, R., Saxey, David, Cerezo, A., Clifton, P., Ulfig, R., Kappers, M., Humphreys, C.
Format:	Journal Article
Published:	2009
Online Access:	http://hdl.handle.net/20.500.11937/35582

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