Atom probe tomography studies of gan-based semiconductor materials
| Main Authors: | , , , , , , , |
|---|---|
| Format: | Journal Article |
| Published: |
2009
|
| Online Access: | http://hdl.handle.net/20.500.11937/35582 |
| _version_ | 1848754535185514496 |
|---|---|
| author | Bennett, S. Oliver, R. Saxey, David Cerezo, A. Clifton, P. Ulfig, R. Kappers, M. Humphreys, C. |
| author_facet | Bennett, S. Oliver, R. Saxey, David Cerezo, A. Clifton, P. Ulfig, R. Kappers, M. Humphreys, C. |
| author_sort | Bennett, S. |
| building | Curtin Institutional Repository |
| collection | Online Access |
| first_indexed | 2025-11-14T08:41:57Z |
| format | Journal Article |
| id | curtin-20.500.11937-35582 |
| institution | Curtin University Malaysia |
| institution_category | Local University |
| last_indexed | 2025-11-14T08:41:57Z |
| publishDate | 2009 |
| recordtype | eprints |
| repository_type | Digital Repository |
| spelling | curtin-20.500.11937-355822018-12-14T01:00:04Z Atom probe tomography studies of gan-based semiconductor materials Bennett, S. Oliver, R. Saxey, David Cerezo, A. Clifton, P. Ulfig, R. Kappers, M. Humphreys, C. 2009 Journal Article http://hdl.handle.net/20.500.11937/35582 10.1017/S1431927609097979 unknown |
| spellingShingle | Bennett, S. Oliver, R. Saxey, David Cerezo, A. Clifton, P. Ulfig, R. Kappers, M. Humphreys, C. Atom probe tomography studies of gan-based semiconductor materials |
| title | Atom probe tomography studies of gan-based semiconductor materials |
| title_full | Atom probe tomography studies of gan-based semiconductor materials |
| title_fullStr | Atom probe tomography studies of gan-based semiconductor materials |
| title_full_unstemmed | Atom probe tomography studies of gan-based semiconductor materials |
| title_short | Atom probe tomography studies of gan-based semiconductor materials |
| title_sort | atom probe tomography studies of gan-based semiconductor materials |
| url | http://hdl.handle.net/20.500.11937/35582 |