APA (7th ed.) Citation

Bennett, S., Oliver, R., Saxey, D., Cerezo, A., Clifton, P., Ulfig, R., . . . Humphreys, C. (2009). Atom probe tomography studies of gan-based semiconductor materials.

Chicago Style (17th ed.) Citation

Bennett, S., R. Oliver, David Saxey, A. Cerezo, P. Clifton, R. Ulfig, M. Kappers, and C. Humphreys. Atom Probe Tomography Studies of Gan-based Semiconductor Materials. 2009.

MLA (9th ed.) Citation

Bennett, S., et al. Atom Probe Tomography Studies of Gan-based Semiconductor Materials. 2009.