Creating a stable oxide at the surface of black phosphorus

The stability of the surface of in situ cleaved black phosphorus crystals upon exposure to atmosphere is investigated with synchrotron-based photoelectron spectroscopy. After 2 days atmosphere exposure a stable subnanometer layer of primarily P2O5 forms at the surface. The work function increases by...

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Main Authors: Edmonds, M., Tadich, A., Carvalho, A., Ziletti, A., O'Donnell, Kane, Koenig, S., Coker, D., Özyilmaz, B., Neto, A., Fuhrer, M.
Format: Journal Article
Published: American Chemical Society 2015
Online Access:http://hdl.handle.net/20.500.11937/35328
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author Edmonds, M.
Tadich, A.
Carvalho, A.
Ziletti, A.
O'Donnell, Kane
Koenig, S.
Coker, D.
Özyilmaz, B.
Neto, A.
Fuhrer, M.
author_facet Edmonds, M.
Tadich, A.
Carvalho, A.
Ziletti, A.
O'Donnell, Kane
Koenig, S.
Coker, D.
Özyilmaz, B.
Neto, A.
Fuhrer, M.
author_sort Edmonds, M.
building Curtin Institutional Repository
collection Online Access
description The stability of the surface of in situ cleaved black phosphorus crystals upon exposure to atmosphere is investigated with synchrotron-based photoelectron spectroscopy. After 2 days atmosphere exposure a stable subnanometer layer of primarily P2O5 forms at the surface. The work function increases by 0.1 eV from 3.9 eV for as-cleaved black phosphorus to 4.0 eV after formation of the 0.4 nm thick oxide, with phosphorus core levels shifting by <0.1 eV. The results indicate minimal charge transfer, suggesting that the oxide layer is suitable for passivation or as an interface layer for further dielectric deposition.
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institution Curtin University Malaysia
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last_indexed 2025-11-14T08:40:53Z
publishDate 2015
publisher American Chemical Society
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spelling curtin-20.500.11937-353282017-09-13T15:19:34Z Creating a stable oxide at the surface of black phosphorus Edmonds, M. Tadich, A. Carvalho, A. Ziletti, A. O'Donnell, Kane Koenig, S. Coker, D. Özyilmaz, B. Neto, A. Fuhrer, M. The stability of the surface of in situ cleaved black phosphorus crystals upon exposure to atmosphere is investigated with synchrotron-based photoelectron spectroscopy. After 2 days atmosphere exposure a stable subnanometer layer of primarily P2O5 forms at the surface. The work function increases by 0.1 eV from 3.9 eV for as-cleaved black phosphorus to 4.0 eV after formation of the 0.4 nm thick oxide, with phosphorus core levels shifting by <0.1 eV. The results indicate minimal charge transfer, suggesting that the oxide layer is suitable for passivation or as an interface layer for further dielectric deposition. 2015 Journal Article http://hdl.handle.net/20.500.11937/35328 10.1021/acsami.5b01297 American Chemical Society restricted
spellingShingle Edmonds, M.
Tadich, A.
Carvalho, A.
Ziletti, A.
O'Donnell, Kane
Koenig, S.
Coker, D.
Özyilmaz, B.
Neto, A.
Fuhrer, M.
Creating a stable oxide at the surface of black phosphorus
title Creating a stable oxide at the surface of black phosphorus
title_full Creating a stable oxide at the surface of black phosphorus
title_fullStr Creating a stable oxide at the surface of black phosphorus
title_full_unstemmed Creating a stable oxide at the surface of black phosphorus
title_short Creating a stable oxide at the surface of black phosphorus
title_sort creating a stable oxide at the surface of black phosphorus
url http://hdl.handle.net/20.500.11937/35328