APA (7th ed.) Citation

Müller, M., Saxey, D., Cerezo, A., & Smith, G. (2010). Nanoscale characterization of compound semiconductors using laser-pulsed atom probe tomography.

Chicago Style (17th ed.) Citation

Müller, M., David Saxey, A. Cerezo, and G. Smith. Nanoscale Characterization of Compound Semiconductors Using Laser-pulsed Atom Probe Tomography. 2010.

MLA (9th ed.) Citation

Müller, M., et al. Nanoscale Characterization of Compound Semiconductors Using Laser-pulsed Atom Probe Tomography. 2010.