Mao, W., Chen, Q., Dai, C., Yang, L., Zhou, Y., & Lu, C. (2010). Effects of piezo-spectroscopic coefficients of 8 wt.% Y2O3 stabilized ZrO2 on residual stress measurement of thermal barrier coatings by Raman spectroscopy. Elsevier S.A.
Chicago Style (17th ed.) CitationMao, W., Q. Chen, C. Dai, L. Yang, Y. Zhou, and Chungsheng Lu. Effects of Piezo-spectroscopic Coefficients of 8 Wt.% Y2O3 Stabilized ZrO2 on Residual Stress Measurement of Thermal Barrier Coatings by Raman Spectroscopy. Elsevier S.A, 2010.
MLA (9th ed.) CitationMao, W., et al. Effects of Piezo-spectroscopic Coefficients of 8 Wt.% Y2O3 Stabilized ZrO2 on Residual Stress Measurement of Thermal Barrier Coatings by Raman Spectroscopy. Elsevier S.A, 2010.
Warning: These citations may not always be 100% accurate.