Atom probe tomography assessment of the impact of electron beam exposure on InxGa1-xN/GaN quantum wells
This study addresses the ongoing debate concerning the distribution of indium in InxGa1−xN quantum wells(QWs) using a combination of atom probe tomography (APT) and transmission electron microscopy(TEM). APT analysis of InxGa1−xN QWs, which had been exposed to the electron beam in a TEM, revealed an...
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Bibliographic Details
| Main Authors: |
Bennett, S.,
Saxey, David,
Kappers, M.,
Barnard, J.,
Humphreys, C.,
Smith, G.,
Oliver, R. |
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| Format: | Journal Article
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| Published: |
2011
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| Online Access: | http://hdl.handle.net/20.500.11937/25817
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