Bennett, S., Saxey, D., Kappers, M., Barnard, J., Humphreys, C., Smith, G., & Oliver, R. (2011). Atom probe tomography assessment of the impact of electron beam exposure on InxGa1-xN/GaN quantum wells.
Chicago Style (17th ed.) CitationBennett, S., David Saxey, M. Kappers, J. Barnard, C. Humphreys, G. Smith, and R. Oliver. Atom Probe Tomography Assessment of the Impact of Electron Beam Exposure on InxGa1-xN/GaN Quantum Wells. 2011.
MLA (9th ed.) CitationBennett, S., et al. Atom Probe Tomography Assessment of the Impact of Electron Beam Exposure on InxGa1-xN/GaN Quantum Wells. 2011.
Warning: These citations may not always be 100% accurate.