Phosphorus d-doped silicon: mixed-atom pseudopotentials and dopant disorder effects
Within a full density functional theory framework we calculate the band structure and doping potential for phosphorus d-doped silicon. We compare two different representations of the dopant plane; pseudo-atoms in which the nuclear charge is fractional between silicon and phosphorus, and explicit arr...
| Main Authors: | , , , |
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| Format: | Journal Article |
| Published: |
IOP
2011
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| Subjects: | |
| Online Access: | http://stacks.iop.org/Nano/22/065701 http://hdl.handle.net/20.500.11937/24873 |
| Summary: | Within a full density functional theory framework we calculate the band structure and doping potential for phosphorus d-doped silicon. We compare two different representations of the dopant plane; pseudo-atoms in which the nuclear charge is fractional between silicon and phosphorus, and explicit arrangements employing distinct silicon and phosphorus atoms. While the pseudo-atom approach offers several computational advantages, the explicit model calculations differ in a number of key points, including the valley splitting, the Fermi level and the width of the doping potential. These findings have implications for parameters used in device modelling. |
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