A combined voltammetric and synchrotron radiation-grazing incidence X-ray diffraction study of the electrocrystallization of zinc tetracyanoquinodimethane

The in situ electrocrystallization of zinc tetracyanoquinodimethane (TCNQ) has been explored using synchrotron radiation-grazing incidence X-ray diffraction (SR-GIXRD) at potentials in the region of the cyclic voltammetric peak where reduction of TCNQ to TCNQ– occurs at a Pt electrode in acetonitril...

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Bibliographic Details
Main Authors: Veder, J., Nafady, A., Clarke, G., De Marco, Roland, Bond, A.
Format: Journal Article
Published: 2012
Online Access:http://hdl.handle.net/20.500.11937/23641
Description
Summary:The in situ electrocrystallization of zinc tetracyanoquinodimethane (TCNQ) has been explored using synchrotron radiation-grazing incidence X-ray diffraction (SR-GIXRD) at potentials in the region of the cyclic voltammetric peak where reduction of TCNQ to TCNQ– occurs at a Pt electrode in acetonitrile (0.1 M [NBu4][PF6]) solution containing Zn(NO3)2·6H2O. The in situ SR-GIXRD data along with ex situ IR and Raman spectroscopy results all confirmed the formation of the kinetically favoured phase of Zn[TCNQ]2(H2O)2 as the product.