Nano-and micro-geochronology in Hadean and Archean zircons by atom-probe tomography and SIMS: New tools for old minerals

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Nano-and micro-geochronology in Hadean and Archean zircons by atom-probe tomography and SIMS: New tools for old minerals

Atom-probe tomography (APT) and secondary ion mass spectrometry (SIMS) provide complementary in situ element and isotope data in minerals such as zircon. SIMS measures isotope ratios and trace elements from 1–20 μm spots with excellent accuracy and precision. APT identifies mass/charge and three-dim...

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Bibliographic Details
Main Authors:	Valley, J., Reinhard, D., Cavosie, Aaron, Ushikubo, T., Lawrence, D., Larson, D., Kelly, T., Snoeyenbos, D., Strickland, A.
Format:	Journal Article
Published:	Walter de Gruyter GmbH 2015
Online Access:	http://hdl.handle.net/20.500.11937/22684

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