Infrared microscopy studies of the chemical composition of latent fingermark residues
Synchrotron-infrared microscopy provides a non-destructive technique to investigate the chemical composition of latent fingermarks in-situ. The high spatial resolution and brightness of the synchrotron source also lends itself to the chemical characterisation of trace amounts of material on surfaces...
| Main Authors: | Fritz, Patrick, Van Bronswijk, Wilhelm, Lepkova, Katerina, Lewis, Simon, Lim, K., Martin, D., Puskar, L. |
|---|---|
| Format: | Journal Article |
| Published: |
Elsevier
2013
|
| Online Access: | http://hdl.handle.net/20.500.11937/21063 |
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