Characterisation of preferred orientation in crystalline materials by x-ray powder diffraction.

Characterisation of preferred orientation in crystalline materials by x-ray powder diffraction.

Texture, i.e. preferred orientation, can cause large systematic errors in quantitative analysis of crystalline materials using x-ray powder diffraction (XRPD) data. Various mathematical forms have been proposed for the application of preferred orientation corrections. The most promising of these app...

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Bibliographic Details
Main Author: Sitepu, Husinsyah
Format: Thesis
Language:English
Published: Curtin University 1991
Subjects:
texture
March model
x-ray powder diffraction
crystalline materials
preferred orientation
Online Access:http://hdl.handle.net/20.500.11937/1897

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