Correlated ion analysis and the interpretation of atom probe mass spectra
Several techniques are presented for extracting information from atom probe mass spectra by investigating correlations within multiple-ion detector events. Analyses of this kind can provide insights into the origins of noise, the shape of mass peaks, or unexpected anomalies within the spectrum. Data...
| Main Author: | |
|---|---|
| Format: | Journal Article |
| Published: |
2011
|
| Online Access: | http://hdl.handle.net/20.500.11937/17392 |
| _version_ | 1848749454511833088 |
|---|---|
| author | Saxey, David |
| author_facet | Saxey, David |
| author_sort | Saxey, David |
| building | Curtin Institutional Repository |
| collection | Online Access |
| description | Several techniques are presented for extracting information from atom probe mass spectra by investigating correlations within multiple-ion detector events. Analyses of this kind can provide insights into the origins of noise, the shape of mass peaks, or unexpected anomalies within the spectrum. Data can often be recovered from within the spectrum noise by considering the time-of-flight differences between ions within a multiple event. Correlated ion detection, particularly when associated with shifts in ion energies, may be used to probe the phenomenon of molecular ion dissociation, including the questions of data loss due to ion pile-up or the generation of neutrals in the dissociation process. |
| first_indexed | 2025-11-14T07:21:12Z |
| format | Journal Article |
| id | curtin-20.500.11937-17392 |
| institution | Curtin University Malaysia |
| institution_category | Local University |
| last_indexed | 2025-11-14T07:21:12Z |
| publishDate | 2011 |
| recordtype | eprints |
| repository_type | Digital Repository |
| spelling | curtin-20.500.11937-173922017-09-13T15:44:33Z Correlated ion analysis and the interpretation of atom probe mass spectra Saxey, David Several techniques are presented for extracting information from atom probe mass spectra by investigating correlations within multiple-ion detector events. Analyses of this kind can provide insights into the origins of noise, the shape of mass peaks, or unexpected anomalies within the spectrum. Data can often be recovered from within the spectrum noise by considering the time-of-flight differences between ions within a multiple event. Correlated ion detection, particularly when associated with shifts in ion energies, may be used to probe the phenomenon of molecular ion dissociation, including the questions of data loss due to ion pile-up or the generation of neutrals in the dissociation process. 2011 Journal Article http://hdl.handle.net/20.500.11937/17392 10.1016/j.ultramic.2010.11.021 fulltext |
| spellingShingle | Saxey, David Correlated ion analysis and the interpretation of atom probe mass spectra |
| title | Correlated ion analysis and the interpretation of atom probe mass spectra |
| title_full | Correlated ion analysis and the interpretation of atom probe mass spectra |
| title_fullStr | Correlated ion analysis and the interpretation of atom probe mass spectra |
| title_full_unstemmed | Correlated ion analysis and the interpretation of atom probe mass spectra |
| title_short | Correlated ion analysis and the interpretation of atom probe mass spectra |
| title_sort | correlated ion analysis and the interpretation of atom probe mass spectra |
| url | http://hdl.handle.net/20.500.11937/17392 |