APA (7th ed.) Citation

Sairi, M., Chen-Tan, N., Neusser, G., Kranz, C., & Arrigan, D. (2015). Electrochemical Characterisation of Nanoscale Liquid | Liquid Interfaces Located at Focused Ion Beam-Milled Silicon Nitride Membranes. Wiley-VCH Verlag GmbH & Co. KGaA, Weinheim.

Chicago Style (17th ed.) Citation

Sairi, M., Nigel Chen-Tan, G. Neusser, C. Kranz, and Damien Arrigan. Electrochemical Characterisation of Nanoscale Liquid | Liquid Interfaces Located at Focused Ion Beam-Milled Silicon Nitride Membranes. Wiley-VCH Verlag GmbH & Co. KGaA, Weinheim, 2015.

MLA (9th ed.) Citation

Sairi, M., et al. Electrochemical Characterisation of Nanoscale Liquid | Liquid Interfaces Located at Focused Ion Beam-Milled Silicon Nitride Membranes. Wiley-VCH Verlag GmbH & Co. KGaA, Weinheim, 2015.