Oriented graphite layer formation in Ti/C and TiC/C multilayers deposited by high current pulsed cathodic arc

Ti/C and TiC/C multilayers with periods ranging from 2 to 18 nm were grown by filtered highcurrent pulsed cathodic arc. The growth was monitored in situ by ellipsometry and cantilever stressmeasurements. The ellipsometry results reveal that the optical properties of the carbon vary as afunction of t...

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Main Authors: Persson, P., Ryves, L., Tucker, Mark, McKenzie, D., Bilek, M.
Format: Journal Article
Published: American Institute of Physics 2008
Online Access:http://hdl.handle.net/20.500.11937/12519
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author Persson, P.
Ryves, L.
Tucker, Mark
McKenzie, D.
Bilek, M.
author_facet Persson, P.
Ryves, L.
Tucker, Mark
McKenzie, D.
Bilek, M.
author_sort Persson, P.
building Curtin Institutional Repository
collection Online Access
description Ti/C and TiC/C multilayers with periods ranging from 2 to 18 nm were grown by filtered highcurrent pulsed cathodic arc. The growth was monitored in situ by ellipsometry and cantilever stressmeasurements. The ellipsometry results reveal that the optical properties of the carbon vary as afunction of thickness. Correspondingly, the stress in each carbon layer as measured in situ exhibitstwo well defined values: initially the stress is low and then takes on a higher value for the remainderof the layer. Transmission electron microscopy shows that the initial growth of carbon on Ti or TiClayer is oriented with graphitic basal planes aligned parallel to the interface. After 2–4 nm of growth,the graphitic structure transforms to amorphous carbon. Electron energy loss spectroscopy showsthat the carbon layer simultaneously undergoes a transition from sp2 rich to sp3 rich material.
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institution Curtin University Malaysia
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last_indexed 2025-11-14T06:59:38Z
publishDate 2008
publisher American Institute of Physics
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spelling curtin-20.500.11937-125192017-09-13T15:54:08Z Oriented graphite layer formation in Ti/C and TiC/C multilayers deposited by high current pulsed cathodic arc Persson, P. Ryves, L. Tucker, Mark McKenzie, D. Bilek, M. Ti/C and TiC/C multilayers with periods ranging from 2 to 18 nm were grown by filtered highcurrent pulsed cathodic arc. The growth was monitored in situ by ellipsometry and cantilever stressmeasurements. The ellipsometry results reveal that the optical properties of the carbon vary as afunction of thickness. Correspondingly, the stress in each carbon layer as measured in situ exhibitstwo well defined values: initially the stress is low and then takes on a higher value for the remainderof the layer. Transmission electron microscopy shows that the initial growth of carbon on Ti or TiClayer is oriented with graphitic basal planes aligned parallel to the interface. After 2–4 nm of growth,the graphitic structure transforms to amorphous carbon. Electron energy loss spectroscopy showsthat the carbon layer simultaneously undergoes a transition from sp2 rich to sp3 rich material. 2008 Journal Article http://hdl.handle.net/20.500.11937/12519 10.1063/1.2959835 American Institute of Physics restricted
spellingShingle Persson, P.
Ryves, L.
Tucker, Mark
McKenzie, D.
Bilek, M.
Oriented graphite layer formation in Ti/C and TiC/C multilayers deposited by high current pulsed cathodic arc
title Oriented graphite layer formation in Ti/C and TiC/C multilayers deposited by high current pulsed cathodic arc
title_full Oriented graphite layer formation in Ti/C and TiC/C multilayers deposited by high current pulsed cathodic arc
title_fullStr Oriented graphite layer formation in Ti/C and TiC/C multilayers deposited by high current pulsed cathodic arc
title_full_unstemmed Oriented graphite layer formation in Ti/C and TiC/C multilayers deposited by high current pulsed cathodic arc
title_short Oriented graphite layer formation in Ti/C and TiC/C multilayers deposited by high current pulsed cathodic arc
title_sort oriented graphite layer formation in ti/c and tic/c multilayers deposited by high current pulsed cathodic arc
url http://hdl.handle.net/20.500.11937/12519