Development of an improved field ionization detector incorporating a secondary electron stage

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Development of an improved field ionization detector incorporating a secondary electron stage

Field ionization from sharp tips is attracting increased attention for use in detectors for neutral atomic/molecular species. However, the direct detection of the ionized species typically results in low sensitivities due to the small acceptance angle of the receiving ion-sensitive measurement devic...

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Bibliographic Details
Main Authors:	Fahy, A., O’Donnell, Kane, Barr, M., Zhou, X., Allison, W., Dastoor, P.
Format:	Journal Article
Published:	IOP Publishing Ltd 2011
Subjects:	neutral atom detection helium atom microscopy field ionization
Online Access:	http://hdl.handle.net/20.500.11937/10372

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