Development of an improved field ionization detector incorporating a secondary electron stage
Field ionization from sharp tips is attracting increased attention for use in detectors for neutral atomic/molecular species. However, the direct detection of the ionized species typically results in low sensitivities due to the small acceptance angle of the receiving ion-sensitive measurement devic...
| Main Authors: | , , , , , |
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| Format: | Journal Article |
| Published: |
IOP Publishing Ltd
2011
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| Subjects: | |
| Online Access: | http://hdl.handle.net/20.500.11937/10372 |
| _version_ | 1848746214447644672 |
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| author | Fahy, A. O’Donnell, Kane Barr, M. Zhou, X. Allison, W. Dastoor, P. |
| author_facet | Fahy, A. O’Donnell, Kane Barr, M. Zhou, X. Allison, W. Dastoor, P. |
| author_sort | Fahy, A. |
| building | Curtin Institutional Repository |
| collection | Online Access |
| description | Field ionization from sharp tips is attracting increased attention for use in detectors for neutral atomic/molecular species. However, the direct detection of the ionized species typically results in low sensitivities due to the small acceptance angle of the receiving ion-sensitive measurement device (usually a channel electron multiplier) and can result in sputtering damage due to the relatively high mass and energy of the incident ion species. Here we present a design for a field-ionization-based neutral atom detector incorporating a simple secondary electron generating stage. The use of such a stage decouples the field-ionized species from the detected electron signal, thus eliminating any sputtering damage to the channel electron multiplier. The detector armature discussed is shown to exhibit a linear response to neutral gas pressure and a sensitivity that is improved by more than two orders of magnitude over a previous field ionization detector design. |
| first_indexed | 2025-11-14T06:29:42Z |
| format | Journal Article |
| id | curtin-20.500.11937-10372 |
| institution | Curtin University Malaysia |
| institution_category | Local University |
| last_indexed | 2025-11-14T06:29:42Z |
| publishDate | 2011 |
| publisher | IOP Publishing Ltd |
| recordtype | eprints |
| repository_type | Digital Repository |
| spelling | curtin-20.500.11937-103722017-09-13T14:52:05Z Development of an improved field ionization detector incorporating a secondary electron stage Fahy, A. O’Donnell, Kane Barr, M. Zhou, X. Allison, W. Dastoor, P. neutral atom detection helium atom microscopy field ionization Field ionization from sharp tips is attracting increased attention for use in detectors for neutral atomic/molecular species. However, the direct detection of the ionized species typically results in low sensitivities due to the small acceptance angle of the receiving ion-sensitive measurement device (usually a channel electron multiplier) and can result in sputtering damage due to the relatively high mass and energy of the incident ion species. Here we present a design for a field-ionization-based neutral atom detector incorporating a simple secondary electron generating stage. The use of such a stage decouples the field-ionized species from the detected electron signal, thus eliminating any sputtering damage to the channel electron multiplier. The detector armature discussed is shown to exhibit a linear response to neutral gas pressure and a sensitivity that is improved by more than two orders of magnitude over a previous field ionization detector design. 2011 Journal Article http://hdl.handle.net/20.500.11937/10372 10.1088/0957-0233/22/11/115902 IOP Publishing Ltd restricted |
| spellingShingle | neutral atom detection helium atom microscopy field ionization Fahy, A. O’Donnell, Kane Barr, M. Zhou, X. Allison, W. Dastoor, P. Development of an improved field ionization detector incorporating a secondary electron stage |
| title | Development of an improved field ionization detector incorporating a secondary electron stage |
| title_full | Development of an improved field ionization detector incorporating a secondary electron stage |
| title_fullStr | Development of an improved field ionization detector incorporating a secondary electron stage |
| title_full_unstemmed | Development of an improved field ionization detector incorporating a secondary electron stage |
| title_short | Development of an improved field ionization detector incorporating a secondary electron stage |
| title_sort | development of an improved field ionization detector incorporating a secondary electron stage |
| topic | neutral atom detection helium atom microscopy field ionization |
| url | http://hdl.handle.net/20.500.11937/10372 |