Search Results - Zabah, Nor Farahidah

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    3MeV-electron beam induced threshold voltage shifts and drain current degradation on ZVN3320FTA & ZVP3310FTA commercial MOSFETs

    3MeV-electron beam induced threshold voltage shifts and drain current degradation on ZVN3320FTA & ZVP3310FTA commercial MOSFETs by Abubakkar, Sheik Fareed Ookar, Hasbullah, Nurul Fadzlin, Zabah, Nor Farahidah, Abdullah, Yusof

    Published 2014
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