Search Results - WHITE, J. D.

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  1. 1
    New technique for in-situ measurement of backscattered and secondary electron yields for the calculation of signal-to-noise ratio in a SEM

    New technique for in-situ measurement of backscattered and secondary electron yields for the calculation of signal-to-noise ratio in a SEM by SIM, K. S., WHITE, J. D.

    Published 2005
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  2. 2
    Observing the Evolution of Neural Networks Learning to Play the Game of Othello

    Observing the Evolution of Neural Networks Learning to Play the Game of Othello by Chong, S.Y., Tan, M.K., White, J.D.

    Published 2005
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