Search Results - Ulfig, R.

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    Atom probe tomography studies of gan-based semiconductor materials

    Atom probe tomography studies of gan-based semiconductor materials by Bennett, S., Oliver, R., Saxey, David, Cerezo, A., Clifton, P., Ulfig, R., Kappers, M., Humphreys, C.

    Published 2009
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    Best practices for reporting atom probe analysis of geological materials

    Best practices for reporting atom probe analysis of geological materials by Blum, T., Darling, J., Kelly, T., Larson, D., Moser, D., Perez-Huerta, A., Prosa, T., Reddy, Steven, Reinhard, D., Saxey, David, Ulfig, R., Valley, J.

    Published 2017
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