Search Results - Tian, G.Y.

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  1. 1
    Data fusion for defect characterisation using a dual probe system

    Data fusion for defect characterisation using a dual probe system by Edwards, R.S., Sophian, Ali, Dixon, S., Tian, G.Y.

    Published 2008
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  2. 2
    Wavelet-based PCA defect classification and quantification for pulsed eddy current NDT

    Wavelet-based PCA defect classification and quantification for pulsed eddy current NDT by Tian, G.Y., Sophian, Ali, Taylor, D., Rudlin, J.

    Published 2005
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  3. 3
    Dual EMAT and PEC non-contact probe: applications to defect testing

    Dual EMAT and PEC non-contact probe: applications to defect testing by Edwards, R.S., Sophian, Ali, Dixon, S., Tian, G.-Y., Jian, X.

    Published 2006
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