Search Results - Teh, E. P.

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    Enhanced gettering of iron impurities in bulk silicon by using external direct current electric field

    Enhanced gettering of iron impurities in bulk silicon by using external direct current electric field by Lee, W. P., Teh, E. P., Yow, H. K., Choong, C. L., Tou, T. Y.

    Published 2005
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  2. 2
    Polysilicon Encapsulation Gettering with Electric-Field-Enhanced Isothermal Annealing for Copper Impurities in Bulk Silicon

    Polysilicon Encapsulation Gettering with Electric-Field-Enhanced Isothermal Annealing for Copper Impurities in Bulk Silicon by Lee, W. P., Teh, E. P., Yow, H. K., Choong, C. L., Tou, T. Y.

    Published 2004
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