Search Results - TOU, T. Y.

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  1. 1
    PLUME DYNAMICS IN TEA CO2 LASER ABLATION OF POLYMERS AND GRAPHITE

    PLUME DYNAMICS IN TEA CO2 LASER ABLATION OF POLYMERS AND GRAPHITE by TOU, T. Y., CHIN, O. H.

    Published 2008
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  2. 2
    Target-plane deposition of diamond-like carbon in pulsed laser ablation of graphite

    Target-plane deposition of diamond-like carbon in pulsed laser ablation of graphite by Yap, S.S., Tou, T.Y.

    Published 2007
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  3. 3
    Crystal structure of (dibenzoylmethanato) catecholato)boron(center dot)catechol

    Crystal structure of (dibenzoylmethanato) catecholato)boron(center dot)catechol by Lim, H. C., Ng, S. W., Tou, T. Y.

    Published 2000
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  4. 4
    Efficient Detection and Size Determination of Crystal Originated “Particles” (COPs) on Silicon Wafer Surface Using Optical Scattering Technique Integrated to an Atomic Force Microscope

    Efficient Detection and Size Determination of Crystal Originated “Particles” (COPs) on Silicon Wafer Surface Using Optical Scattering Technique Integrated to an Atomic... by Lee, W.-P., Yow, H.-K., Tou, T.-Y.

    Published 2004
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  5. 5
    Characterization of Crystal-Originated Particles in Silicon Nitride Doped, CZ-Grown Silicon Wafers

    Characterization of Crystal-Originated Particles in Silicon Nitride Doped, CZ-Grown Silicon Wafers by Lee, W. P., Yow, H. K., Tou, T. Y.

    Published 2006
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  6. 6
    Detection of Kite-Shaped COPs in Nitrogen-Doped Czochralski-Grown Silicon Wafers

    Detection of Kite-Shaped COPs in Nitrogen-Doped Czochralski-Grown Silicon Wafers by Lee, W. P., Yow, H. K., Tou, T. Y.

    Published 2004
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  7. 7
    Enhanced reliability by diamond-like carbon in single-layer organic light emitting diodes

    Enhanced reliability by diamond-like carbon in single-layer organic light emitting diodes by Yap, S.-S., Yang, R.-B., Yow, H.-K., Tou, T.-Y.

    Published 2006
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  8. 8
    Analysis of Atomic Force Microscopy Images of Crystal Originated “Particles” on Silicon Wafers Treated with NH4OH:H2O2:H2O Solution

    Analysis of Atomic Force Microscopy Images of Crystal Originated “Particles” on Silicon Wafers Treated with NH4OH:H2O2:H2O Solution by Lee, W. P., Seow, W. S., Yow, H. K., Tou, T. Y.

    Published 2001
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  9. 9
    Optimization of a Rhodamine 6G-doped PMMA thin-slab laser

    Optimization of a Rhodamine 6G-doped PMMA thin-slab laser by Tou, T.Y., Yap, S.S., Chin, O.H., Ng, S.W.

    Published 2007
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  10. 10
    Enhanced gettering of iron impurities in bulk silicon by using external direct current electric field

    Enhanced gettering of iron impurities in bulk silicon by using external direct current electric field by Lee, W. P., Teh, E. P., Yow, H. K., Choong, C. L., Tou, T. Y.

    Published 2005
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  11. 11
    Polysilicon Encapsulation Gettering with Electric-Field-Enhanced Isothermal Annealing for Copper Impurities in Bulk Silicon

    Polysilicon Encapsulation Gettering with Electric-Field-Enhanced Isothermal Annealing for Copper Impurities in Bulk Silicon by Lee, W. P., Teh, E. P., Yow, H. K., Choong, C. L., Tou, T. Y.

    Published 2004
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