Search Results - Soon, F.Y.

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    Negative bias temperature instability characterization and lifetime evaluations of submicron pMOSFET

    Negative bias temperature instability characterization and lifetime evaluations of submicron pMOSFET by Hatta, Sharifah Wan M., Hussin, Hanim Yati, Soon, F.Y., Abdul Wahab, Yasmin, Abdul Hadi, Dayanasari, Soin, Norhayati, Alam, A. H.M.Zahirul, Nordin, Anis Nurashikin

    Published 2017
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