Search Results - Romano, G.

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  1. 1
    Body diode reliability investigation of SiC power MOSFETs

    Body diode reliability investigation of SiC power MOSFETs by Fayyaz, A., Romano, G., Castellazzi, Alberto

    Published 2016
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  2. 2
    SiC power MOSFETs performance, robustness and technology maturity

    SiC power MOSFETs performance, robustness and technology maturity by Castellazzi, Alberto, Fayyaz, Asad, Romano, G., Yang, Li, Riccio, M., Irace, A.

    Published 2016
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  3. 3
    Influence of gate bias on the avalanche ruggedness of SiC power MOSFETs

    Influence of gate bias on the avalanche ruggedness of SiC power MOSFETs by Fayyaz, Asad, Castellazzi, Alberto, Romano, G., Riccio, M., Urresti, J., Wright, N.

    Published 2017
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