Search Results - Reinhard, D.
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Mechanisms of deformation-induced trace element migration in zircon resolved by atom probe and correlative microscopy by Reddy, Steven, van Riessen, A., Saxey, D., Johnson, T., Rickard, W., Fougerouse, D., Fischer, S., Prosa, T., Rice, K., Reinhard, D., Chen, Y., Olson, D.
Published 2016Get full text
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Atom probe tomography analysis of the reference zircon gj-1: An interlaboratory study by Exertier, F., La Fontaine, A., Corcoran, C., Piazolo, S., Belousova, E., Peng, Z., Gault, B., Saxey, David, Fougerouse, Denis, Reddy, Steven, Pedrazzini, S., Bagot, P., Moody, M., Langelier, B., Moser, D., Botton, G., Vogel, F., Thompson, G., Blanchard, P., Chiaramonti, A., Reinhard, D., Rice, K., Schreiber, D., Kruska, K., Wang, J., Cairney, J.
Published 2018Get full text