Search Results - Recht, F.

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    Scanning Ion Probe Studies of Silicon Implantation Profiles in AlGaN/GaN HEMT Heterostructures

    Scanning Ion Probe Studies of Silicon Implantation Profiles in AlGaN/GaN HEMT Heterostructures by Kocan, M., Umana-Membreno, G., Kilburn, M., Fletcher, Ian, Recht, F., McCarthy, L., Mishra, U., Nener, B., Parish, G.

    Published 2008
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