Search Results - Prosa, T.
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Mechanisms of deformation-induced trace element migration in zircon resolved by atom probe and correlative microscopy by Reddy, Steven, van Riessen, A., Saxey, D., Johnson, T., Rickard, W., Fougerouse, D., Fischer, S., Prosa, T., Rice, K., Reinhard, D., Chen, Y., Olson, D.
Published 2016Get full text