Search Results - Ong, NanShing

  • Showing 1 - 1 results of 1
Refine Results
  1. 1
    Surface integrity and removal rate of silicon sputtered with focused ion beam

    Surface integrity and removal rate of silicon sputtered with focused ion beam by Hung, NguyenPhu, Ali, Mohammad Yeakub, Fu, Yongqi, Ong, NanShing, Tay, MengLeong

    Published 2001
    Get full text
    Get full text

Search Tools: