Search Results - Nicholas, Mark L.

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    Imaging of crystalline and amorphous surface regions using time-of-flight secondary-ion mass spectrometry (ToF-SIMS): application to pharmaceutical materials

    Imaging of crystalline and amorphous surface regions using time-of-flight secondary-ion mass spectrometry (ToF-SIMS): application to pharmaceutical materials by Iuras, Andrea, Scurr, David J., Boissier, Catherine, Nicholas, Mark L., Roberts, Clive J., Alexander, Morgan R.

    Published 2016
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