Search Results - Muránsky, O.

Hall–Petch Slope in Ultrafine Grained Al-Mg Alloys by Zhou, D., Wang, H., Saxey, David, Muránsky, O., Geng, H., Rickard, William, Quadir, Z., Yang, C., Reddy, Steven, Zhang, D.

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Simultaneous X-ray diffraction, crystallography and fluorescence mapping using the Maia detector by Kirkwood, H., de Jonge, M., Muránsky, O., Hofmann, F., Howard, D., Ryan, C., van Riessen, G., Rowles, Matthew, Paradowska, A., Abbey, B.

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