Search Results - Mohd Fazil, Azlan Faizal

  • Showing 1 - 2 results of 2
Refine Results
  1. 1
    Evaluation of machine learning classifiers in faulty die prediction to maximize cost scrapping avoidance and assembly test capacity savings in semiconductor integrated circuit (IC) manufacturing

    Evaluation of machine learning classifiers in faulty die prediction to maximize cost scrapping avoidance and assembly test capacity savings in semiconductor integrated circuit (IC)... by Mohd Fazil, Azlan Faizal, Mohd Shaharanee, Izwan Nizal, Mohd Jamil, Jastini

    Published 2019
    Get full text
  2. 2
    Framework to reduce cost scrapping and cost of assemble test capacity in semiconductor integrated circuit manufacturing

    Framework to reduce cost scrapping and cost of assemble test capacity in semiconductor integrated circuit manufacturing by Mohd Fazil, Azlan Faizal, Mohd Shaharanee, Izwan Nizal, Mohd Jamil, Jastini, Ang, Jin Sheng

    Published 2020
    Get full text

Search Tools: