Search Results - Lutolf, Matthias

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    3D chemical characterization of frozen hydrated hydrogels using ToF-SIMS with argon cluster sputter depth profiling

    3D chemical characterization of frozen hydrated hydrogels using ToF-SIMS with argon cluster sputter depth profiling by Taylor, Michael, Scurr, David, Lutolf, Matthias, Buttery, Lee D.K., Zelzer, Mischa, Alexander, Morgan R.

    Published 2015
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