Search Results - Long, Adam S.

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    Exposing latent fingermarks on problematic metal surfaces using time of flight secondary ion mass spectroscopy

    Exposing latent fingermarks on problematic metal surfaces using time of flight secondary ion mass spectroscopy by Thandauthapani, Tshaiya Devi, Reeve, Adam J., Long, Adam S., Turner, Ian J., Sharp, James S.

    Published 2018
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