Search Results - Lee, W.-P.

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  1. 1
    Efficient Detection and Size Determination of Crystal Originated “Particles” (COPs) on Silicon Wafer Surface Using Optical Scattering Technique Integrated to an Atomic Force Microscope

    Efficient Detection and Size Determination of Crystal Originated “Particles” (COPs) on Silicon Wafer Surface Using Optical Scattering Technique Integrated to an Atomic... by Lee, W.-P., Yow, H.-K., Tou, T.-Y.

    Published 2004
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  2. 2
    Characterization of Crystal-Originated Particles in Silicon Nitride Doped, CZ-Grown Silicon Wafers

    Characterization of Crystal-Originated Particles in Silicon Nitride Doped, CZ-Grown Silicon Wafers by Lee, W. P., Yow, H. K., Tou, T. Y.

    Published 2006
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  3. 3
    Detection of Kite-Shaped COPs in Nitrogen-Doped Czochralski-Grown Silicon Wafers

    Detection of Kite-Shaped COPs in Nitrogen-Doped Czochralski-Grown Silicon Wafers by Lee, W. P., Yow, H. K., Tou, T. Y.

    Published 2004
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  4. 4
    Analysis of Atomic Force Microscopy Images of Crystal Originated “Particles” on Silicon Wafers Treated with NH4OH:H2O2:H2O Solution

    Analysis of Atomic Force Microscopy Images of Crystal Originated “Particles” on Silicon Wafers Treated with NH4OH:H2O2:H2O Solution by Lee, W. P., Seow, W. S., Yow, H. K., Tou, T. Y.

    Published 2001
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  5. 5
    Enhanced gettering of iron impurities in bulk silicon by using external direct current electric field

    Enhanced gettering of iron impurities in bulk silicon by using external direct current electric field by Lee, W. P., Teh, E. P., Yow, H. K., Choong, C. L., Tou, T. Y.

    Published 2005
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  6. 6
    Polysilicon Encapsulation Gettering with Electric-Field-Enhanced Isothermal Annealing for Copper Impurities in Bulk Silicon

    Polysilicon Encapsulation Gettering with Electric-Field-Enhanced Isothermal Annealing for Copper Impurities in Bulk Silicon by Lee, W. P., Teh, E. P., Yow, H. K., Choong, C. L., Tou, T. Y.

    Published 2004
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