Search Results - Hutagalung, Sabar D.
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Pinch-off effect in p-type double gate and single gate junctionless silicon nanowire transistor fabricated by atomic force microscopy nanolithography by Larki, Farhad, Dehzangi, Arash, Hassan, Jumiah, Abedini, Alam, Saion, Elias, Hutagalung, Sabar D., Abdullah, A. Makarimi, Hamidon, Mohd. Nizar
Published 2013Get full text
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Fabrication of p-type Double gate and Single gate Junctionless silicon nanowire transistor by Atomic force microscopy nanolithography by Dehzangi, Arash, Larki, Farhad, Hassan, Jumiah, Hutagalung, Sabar D., Saion, Elias, Hamidon, Mohd Nizar, Abdullah, A. Makarimi, Kharazmi, Alireza, Mohammadi, Sanaz, Majlis, Burhanoddin Y.
Published 2013Get full text
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Dependency of electrical characteristics on nano gap variation in pinch off lateral gate transistors by Larki, Farhad, Dehzangi, Arash, Md. Ali, Sawal Hamid, Jalar @ Jalil, Azman, Islam, Md. Shabiul, Yeop Majlis, Burhanuddin, Saion, Elias, Hamidon, Mohd Nizar, Hutagalung, Sabar D.
Published 2014Get full text
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Impact of KOH etching on nanostructure fabricated by local anodic oxidation method by Dehzangi, Arash, Larki, Farhad, Majlis, Burhanuddin Yeop, Naseri, Mahmood Goodarz, Navasery, Manizheh, Abdullah, A. Makarimi, Hutagalung, Sabar D., Abdul Hamid, Norihan, Mohd Noor, Mimiwaty, Vakilian, Mohammadmahdi, Saion, Elias
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Atomic force microscope base nanolithography for reproducible micro and nanofabrication by Dehzangi, Arash, Larki, Farhad, Yeop Majlis, Burhanuddin, Kazemi, Zainab, Ariannejad, Mohammadmahdi, Abdullah, Ahmad Makarimi, Naseri, Mahmoud Goodarz, Navasery, Manizheh, Saion, Elias, Mohamed Kamari, Halimah, Khalilzadeh, Nasrin, Hutagalung, Sabar D.
Published 2014Get full text
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