Search Results - Heinonen, M.

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    Atomic force microscope adhesion measurements and atomistic molecular dynamics simulations at different humidities

    Atomic force microscope adhesion measurements and atomistic molecular dynamics simulations at different humidities by Seppä, J., Reischl, Bernhard, Sairanen, H., Korpelainen, V., Husu, H., Heinonen, M., Raiteri, P., Rohl, Andrew, Nordlund, K., Lassila, A.

    Published 2017
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