Search Results - Fujiwara, Hideo

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  1. 1
    A new class of sequential circuits with acyclic test generation complexity

    A new class of sequential circuits with acyclic test generation complexity by Ooi, Chia Yee, Fujiwara, Hideo

    Published 2006
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  2. 2
    A new scan design technique based on pre-synthesis thru functions

    A new scan design technique based on pre-synthesis thru functions by Chia, Yee Ooi, Fujiwara, Hideo

    Published 2006
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