Search Results - Dai, Tianxiang

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    Built-in reliability design of highly integrated solid-state power switches with metal bump interconnects

    Built-in reliability design of highly integrated solid-state power switches with metal bump interconnects by Li, Jianfeng, Castellazzi, Alberto, Dai, Tianxiang, Corfield, Martin, Solomon, Adane Kassa, Johnson, Christopher Mark

    Published 2015
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  2. 2
    Built-in reliability design of highly integrated solid-state power switches with metal bump interconnects

    Built-in reliability design of highly integrated solid-state power switches with metal bump interconnects by Li, Jianfeng, Castellazzi, Alberto, Dai, Tianxiang, Corfield, Martin, Solomon, Adane Kassa, Johnson, Christopher Mark

    Published 2015
    Get full text

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