Search Results - Castellazzi, A.

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  1. 1
    High temperature pulsed-gate robustness testing of SiC power MOSFETs

    High temperature pulsed-gate robustness testing of SiC power MOSFETs by Fayyaz, A., Castellazzi, A.

    Published 2015
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  2. 2
    GaN HEMT gate-driver for achieving high power converter integration levels

    GaN HEMT gate-driver for achieving high power converter integration levels by Wu, H, Garcia, J., Castellazzi, A.

    Published 2018
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  3. 3
    Individual device active cooling for enhanced system-level power density and more uniform temperature distribution

    Individual device active cooling for enhanced system-level power density and more uniform temperature distribution by Zeng, Y., Hussein, A., Castellazzi, A.

    Published 2018
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  4. 4
    Impact of underfill and other physical dimensions on Silicon Lateral IGBT package reliability using computer model with discrete and continuous design variables

    Impact of underfill and other physical dimensions on Silicon Lateral IGBT package reliability using computer model with discrete and continuous design variables by Rajaguru, P., Lu, H., Bailey, C., Castellazzi, A., Pathirana, V., Udugampola, N., Udrea, F.

    Published 2018
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