Search Results - Batool, Uzma

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    An attention-augmented convolutional neural network with focal loss for mixed-type wafer defect classification

    An attention-augmented convolutional neural network with focal loss for mixed-type wafer defect classification by Batool, Uzma, Mohd Ibrahim, Shapiai, Mostafa, Salama A., Mohd Zamri, Ibrahim

    Published 2023
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