Search Results - Barnard, J.

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    Atom probe tomography assessment of the impact of electron beam exposure on InxGa1-xN/GaN quantum wells

    Atom probe tomography assessment of the impact of electron beam exposure on InxGa1-xN/GaN quantum wells by Bennett, S., Saxey, David, Kappers, M., Barnard, J., Humphreys, C., Smith, G., Oliver, R.

    Published 2011
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