Armstrong, N., Kalceff, W., Cline, J. P., & Bonevich, J. E. (2004). Bayesian Inference of Nanoparticle-Broadened X-Ray Line Profiles. [Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology.
Chicago Style CitationArmstrong, Nicholas, Walter Kalceff, James P. Cline, and John E. Bonevich. Bayesian Inference of Nanoparticle-Broadened X-Ray Line Profiles. [Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology, 2004.
MLA CitationArmstrong, Nicholas, Walter Kalceff, James P. Cline, and John E. Bonevich. Bayesian Inference of Nanoparticle-Broadened X-Ray Line Profiles. [Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology, 2004.
Warning: These citations may not always be 100% accurate.