Full spatial characterization of a nanofocused x-ray free-electron laser beam by ptychographic imaging

Full spatial characterization of a nanofocused x-ray free-electron laser beam by ptychographic imaging

The emergence of hard X-ray free electron lasers (XFELs) enables new insights into many fields of science. These new sources provide short, highly intense, and coherent X-ray pulses. In a variety of scientific applications these pulses need to be strongly focused. In this article, we demonstrate foc...

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Bibliographic Details
Main Authors: Schropp, Andreas, Hoppe, Robert, Meier, Vivienne, Patommel, Jens, Seiboth, Frank, Lee, Hae Ja, Nagler, Bob, Galtier, Eric C., Arnold, Brice, Zastrau, Ulf, Hastings, Jerome B., Nilsson, Daniel, Uhlén, Fredrik, Vogt, Ulrich, Hertz, Hans M., Schroer, Christian G.
Format: Online
Language:English
Published: Nature Publishing Group 2013
Online Access:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3620670/

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3620670/

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