Saw, S. H., Rawat, R. S., Lee, P., Talebitaher, A., Abdou, A. E., Chong, P. L., . . . Lee, S. (2013). SXR Measurements in INTI PF Operated in Neon to Identify Typical (Normal N) Profile for Shots with Good Yield. IEEE.

Saw, Sor Heoh, Rajdeep S. Rawat, Paul Lee, Alireza Talebitaher, Ali. E. Abdou, Perk Lin Chong, Federico Roy, Jalil Ali, and Sing Lee. SXR Measurements in INTI PF Operated in Neon to Identify Typical (Normal N) Profile for Shots With Good Yield. IEEE, 2013.

Saw, Sor Heoh, et al. SXR Measurements in INTI PF Operated in Neon to Identify Typical (Normal N) Profile for Shots With Good Yield. IEEE, 2013.