Sub-Ångstrom electric field measurements on a universal detector in a scanning transmission electron microscope

Sub-Ångstrom electric field measurements on a universal detector in a scanning transmission electron microscope

Abstract Scanning transmission electron microscopy (STEM) excels in accessing atomic-scale structure and chemistry. Enhancing our ability to directly image the functionalities of local features in materials has become one of the most important topics in the future development of STEM. Recently, diff...

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Bibliographic Details
Main Authors: Jordan A. Hachtel, Juan Carlos Idrobo, Miaofang Chi
Format: Article
Language:English
Published: Springer 2018-08-01
Series:Advanced Structural and Chemical Imaging
Subjects:
Differential phase contrast
4D STEM
Sub-Ångstrom resolution
Octahedral tilts
Online Access:http://link.springer.com/article/10.1186/s40679-018-0059-4

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http://link.springer.com/article/10.1186/s40679-018-0059-4

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